GROWTH AND CHARACTERIZATION OF La5/8Ca3/8MnO3 FILMS BY PULSED LASER DEPOSITION ON SILICON WAFER SUBSTRATE

 

M. Navaseri, S.A. Halim*, K.P.Lim, S.K.Chen and R. Abd-Shukor

 

Department of Physics, Faculty of Science, Universiti Putra Malaysia

43400 UPM Serdang, Selangor, Malaysia

 

Corresponding author: ahalim@upm.edu.my

 

 

 ABSTRACT

 

By pulsed laser ablation magnetoresistive perovskite-like La5/8Ca3/8MnO3 films have been successfully grown on silicon wafer substrates without any buffer layer. The X-ray diffraction (XRD) patterns of the LCMO/Si heterostructure indicate that well crystalline LCMO grows polycrystalline with average grain size of 15nm. The LCMO films exhibited typical characteristics of CMR material with the metal-insulator transition temperature at TP=245 K. The film has a maximum %MR of about %16.52 and mean surface roughness of about 147.4 nm.

 

Keywords: Magnetoresistance;  manganite;  grain boundary;  metal–insulator transition temperature

 

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